Use when designing or auditing a USENIX FAST storage evaluation, covering real devices and firmware, device-state control (aging, preconditioning, fill, TRIM), standard workloads and traces (SNIA IOTTA, YCSB, filebench, fio), write amplification, tail latency, endurance and wear, crash-consistency testing, fair baselines, and matching the metric to the shape of each storage claim.
