Coordinate measuring machine (CMM) metrology — probe qualification (stylus tip radius calibration, PD and MPEE specifications per ISO 10360), Gaussian vs Chebyshev (minimax) fitting algorithms, GD&T feature measurement (flatness, circularity, cylindricity, true position, profile), lobing error, thermal compensation (CTE correction, 20°C reference), measurement uncertainty (ISO GUM, repeatability+reproducibility+accuracy), stylus qualification, probing error MPEP, ASTM E2309, VDA 5 process capability.
